
W48S87-72
12
Absolute Maximum Ratings
Stresses greater than those listed in this table may cause per-
manent damage to the device. These represent a stress rating
only. Operation of the device at these or any other conditions
above those specified in the operating sections of this specifi-
cation is not implied. Maximum conditions for extended peri-
ods may affect reliability.
.
Parameter
V
DD
, V
IN
T
STG
T
A
T
B
ESD
PROT
Description
Rating
–
0.5 to +7.0
Unit
V
Voltage on any pin with respect to GND
Storage Temperature
–
65 to +150
°
C
Operating Temperature
0 to +70
°
C
Ambient Temperature under Bias
–
55 to +125
°
C
Input ESD Protection
2 (min.)
kV
DC Electrical Characteristics:
T
A
= 0
°
C to +70
°
C, V
DDQ3
= 3.3V±5% (3.135
–
3.465V) f
XTL
= 14.31818 MHz, V
DDQ2
= 2.5±5%
Parameter
Description
Test Condition
Min.
Typ.
Max.
Unit
Supply Current
I
DDQ3
Supply Current (3.3V)
CPUCLK =66.8 MHz
Outputs Loaded
[4]
120
150
200
mA
I
DDQ2
Supply Current (2.5V)
CPUCLK =66.8 MHz
Outputs Loaded
[4]
50
mA
Logic Inputs
V
IL
V
IH
I
IL
I
IH
Clock Outputs
Input Low Voltage
0.8
V
Input High Voltage
Input Low Current
[5]
Input High Current
[5]
2.0
V
10
μA
10
μA
V
OL
V
OH
V
OH
I
OL
Output Low Voltage
I
OL
= 1 mA
I
OH
=
–
1 mA
I
OH
=
–
1 mA
V
OL
= 1.25V
V
OL
= 1.5V
V
OL
= 1.5V
V
OL
= 1.25V
V
OL
= 1.5V
V
OL
= 1.5V
V
OL
= 1.5V
V
OL
= 1.25V
V
OL
= 1.5V
V
OL
= 1.5V
V
OL
= 1.25V
V
OL
= 1.5V
V
OL
= 1.5V
V
OL
= 1.5V
50
mV
Output High Voltage
3.1
V
Output High Voltage (CPU, IOAPIC)
2.2
V
Output Low Current
CPU0:3
155
mA
SDRAM0:7
100
mA
PCI_F, PCI0:5
95
mA
IOAPIC
85
mA
REF0
75
mA
REF1
60
mA
48/24MHZ
60
mA
I
OH
Output High Current
CPU0:3
125
mA
SDRAM0:7
95
mA
PCI_F, PCI0:5
100
mA
IOAPIC
80
mA
REF0
80
mA
REF1
65
mA
48/24MHZ
60
mA
Notes:
4.
5.
All clock outputs loaded with maximum lump capacitance test load specified in AC Electrical Characteristics section.
W48S87-72 logic inputs have internal pull-up devices. (Not CMOS level.)