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參數資料
| 型號： | W3EG7265S262JD3 |
| 英文描述： | 512MB - 2x32Mx72 DDR SDRAM REGISTERED, w/PLL |
| 中文描述： | 512MB的- 2x32Mx72 DDR SDRAM的注冊，瓦特/鎖相環 |
| 文件頁數： | 7/12頁 |
| 文件大小： | 208K |
| 代理商： | W3EG7265S262JD3 |
7
White Electronic Designs Corporation (602) 437-1520 www.wedc.com
White Electronic Designs
W3EG7265S-JD3
PRELIMINARY
January 2005
Rev. 3
I
DD1
: OPERATING CURRENT: ONE BANK
1. Typical Case: V
CC
= 2.5V, T = 25°C
2. Worst Case: V
CC
= 2.7V, T = 10°C
3. Only one bank is accessed with t
RC
(min), Burst
Mode, Address and Control inputs on NOP edge are
changing once per clock cycle. l
OUT
= 0mA
4. Timing patterns
DDR200 (100MHz, CL = 2) : t
CK
= 10ns, CL2, BL = 4,
t
RCD
= 2*t
CK
, t
RAg
= 5*t
CK
Read: A0 N R0 N N P0 N A0 N - repeat the same
timing with random address changing; 50% of data
changing at every burst
DDR266 (133MHz, CL = 2.5) : t
CK
= 7.5ns, CL = 2.5,
BL = 4, t
RCD
= 3*t
CK
, t
RC
= 9*t
CK
, t
RAg
= 5*t
CK
Read: A0 N N R0 N P0 N N N A0 N - repeat the
same timing with random address changing; 50% of
data changing at every burst
DDR266 (133MHz, CL = 2) : t
CK
= 7.5ns, CL = 2, BL
= 4, t
RCD
= 3*t
CK
, t
RC
= 9*t
CK
, t
RAg
= 5*t
CK
Read: A0 N N R0 N P0 N N N A0 N - repeat the
same timing with random address changing; 50% of
data changing at every burst
I
DD7A
: OPERATING CURRENT: FOUR BANKS
1. Typical Case: V
CC
= 2.5V, T = 25°C
2. Worst Case: V
CC
= 2.7V, T = 10°C
3. Four banks are being interleaved with t
RC
(min), Burst
Mode, Address and Control inputs on NOP edge are
not changing.
lout = 0mA
4. Timing patterns
DDR200 (100MHz, CL = 2) : t
CK
= 10ns, CL2, BL = 4,
t
RRD
= 2*t
CK
, t
RCD
= 3*t
CK
, Read with autoprecharge
Read: A0 N A1 R0 A2 R1 A3 R2 A0 R3 A1 R0
- repeat the same timing with random address
changing; 100% of data changing at every burst
DDR266 (133MHz, CL = 2.5) : t
CK
= 7.5ns, CL =
2.5, BL = 4, t
RRD
= 3*t
CK
, t
RCD
= 3*t
CK
Read with
autoprecharge
Read: A0 N A1 R0 A2 R1 A3 R2 N R3 A0 N A1
R0 - repeat the same timing with random address
changing; 100% of data changing at every burst
DDR266 (133MHz, CL = 2): t
CK
= 7.5ns, CL2 = 2, BL
= 4, t
RRD
= 2*t
CK
, t
RCD
= 3*t
CK
Read: A0 N A1 R0 A2 R1 A3 R2 N R3 A0 N A1
R0 - repeat the same timing with random address
changing; 100% of data changing at every burst
DETAILED TEST CONDITIONS FOR DDR SDRAM I
DD1
& I
DD7A
Legend: A = Activate, R = Read, W = Write, P = Precharge, N = NOP
A (0-3) = Activate Bank 0-3
R (0-3) = Read Bank 0-3
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相關代理商/技術參數 |
參數描述 |
|---|---|
| W3EG7265S265JD3 | 制造商:WEDC 制造商全稱:White Electronic Designs Corporation 功能描述:512MB - 2x32Mx72 DDR SDRAM REGISTERED, w/PLL |
| W3EG7265S-JD3 | 制造商:WEDC 制造商全稱:White Electronic Designs Corporation 功能描述:512MB - 2x32Mx72 DDR SDRAM REGISTERED, w/PLL |
| W3EG7266S202AD4 | 制造商:WEDC 制造商全稱:White Electronic Designs Corporation 功能描述:512MB - 64Mx72 DDR SDRAM UNBUFFERED ECC w/PLL |
| W3EG7266S202AD4I | 制造商:WEDC 制造商全稱:White Electronic Designs Corporation 功能描述:512MB - 64Mx72 DDR SDRAM UNBUFFERED ECC w/PLL |
| W3EG7266S202BD4I | 制造商:WEDC 制造商全稱:White Electronic Designs Corporation 功能描述:512MB - 64Mx72 DDR SDRAM UNBUFFERED ECC w/PLL |
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